Eur. Phys. J. Appl. Phys.
Volume 52, Number 3, December 2010
|Number of page(s)||4|
|Section||Semiconductors and Devices|
|Published online||30 November 2010|
Structural and optical properties of thermally evaporated ZnS thin films
Department of Physics, Damascus University, Damascus, Syria
2 Higher Institute for Laser Research and Application (HILRA), Damascus University, Damascus, Syria
Corresponding author: firstname.lastname@example.org
Accepted: 18 August 2010
Published online: 30 November 2010
In this work, we present experimental evidence and analytical studies of the XRD patterns and optical characterizations of ZnS films with different optical thicknesses. Thin films of ZnS were deposited on glass substrates by thermal evaporation. The crystallite size increased as the optical thicknesses. The overall absorbance has been increased with the film thickness and the direct band gap was obtained. It decreases with the increasing in the thickness of the films.
© EDP Sciences, 2010
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