Issue |
Eur. Phys. J. Appl. Phys.
Volume 52, Number 2, November 2010
Focus on Numelec
|
|
---|---|---|
Article Number | 23308 | |
Number of page(s) | 5 | |
DOI | https://doi.org/10.1051/epjap/2010082 | |
Published online | 21 October 2010 |
https://doi.org/10.1051/epjap/2010082
Modeling of thin structures in eddy current testing with shell elements
Laboratoire de Génie Électrique de Paris, SUPELEC, Univ. Paris-Sud, UPMC Univ. Paris 06, CNRS (UMR 8507), 11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France
Corresponding author: alejandro.ospina@lgep.supelec.fr
Received:
14
December
2009
Revised:
1
April
2010
Accepted:
8
May
2010
Published online:
21
October
2010
The modeling and design of eddy currents sensors for non-destructive testing applications, generally, requires numerical methods. Among these methods, the finite element method is one of the most used. Indeed, it presents a great capability to treat a large variety of configurations. However, in the study of eddy current testing problems, the existence of structures that have a geometrical dimension smaller than the others (thin air gaps, coatings...) will lead to difficulties related to the meshing process. The introduction of particular elements such as shell elements allows to simplify the modeling of these problems. In this paper, the shell elements are used in two different 2D axisymmetric formulations, the electric formulation a* and the magnetic formulation t-ϕ in order to simulate the behaviour of the electromagnetic fields. The results obtained with the two formulations are compared with analytical solutions.
© EDP Sciences, 2010
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.