Eur. Phys. J. Appl. Phys.
Volume 50, Number 2, May 2010
|Number of page(s)||5|
|Section||Semiconductors and Devices|
|Published online||31 March 2010|
Study of photogenerated traps in nanopixels by random telegraph signal and low frequency noise
Laboratoire de Microélectronique et Instrumentation (UR/03/13-04), Faculté des Sciences de Monastir, Avenue de l'Environnement, 5019 Monastir, Tunisia
2 Équipe Composants Électroniques (UR/99/13-22), Institut Préparatoire aux Études d'Ingénieurs de Nabeul (IPEIN), 8000 Merazka, Nabeul, Tunisia
3 Institut des Nanotechnologies de Lyon (site INSA UMR 5270), Institut National des Sciences Appliquées de Lyon (INL), Bât. Blaise Pascal, 7 avenue Jean Capelle, 69621 Villeurbanne Cedex, France
Corresponding author: firstname.lastname@example.org
Accepted: 12 February 2010
Published online: 31 March 2010
In this work, we present noise analysis in a Single Electron Photo-detector (photo-SET or nanopixel) able to detect one by one electron. We perform the power spectral densities (PSD) of random telegraph signals (RTSs) measured in the dark conditions and under light illumination. Photoinduced RTS can be attributed to the charging of a dot near the current path. From these results, photogenerated traps were identified. It is also found that RTS fluctuations depend on the light wavelength.
© EDP Sciences, 2010
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.