Eur. Phys. J. Appl. Phys.
Volume 46, Number 2, May 2009
|Number of page(s)||5|
|Section||Physics of Organic Materials and Devices|
|Published online||27 March 2009|
Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions
Institute of Solid State Physics, Graz University of
Technology, Graz, Austria
2 Institute of Nanostructured Materials and Photonics, Joanneum Research Forschungsgesellschaft mbH, Weiz, Austria
Corresponding author: firstname.lastname@example.org
Revised: 20 November 2008
Accepted: 20 January 2009
Published online: 27 March 2009
The structural investigations of model organic systems like pentacene on silicon oxide in the monolayer regime is very important for the basic understanding of initial nucleation process together with the electronic performance of transistor devices. A method for the evaluation of the island formation and layer closing of the first monolayer is introduced. The method is based on specular X-ray reflectivity and diffuse scattering and reveal integral information on the coverage together with the size and separation of pentacene islands. The results are in good agreement with AFM investigation that encourages the use of this type of investigation in in-situ experiments.
PACS: 61.05.cc – Theories of X-ray diffraction and scattering / 61.05.cm – X-ray reflectometry (surfaces, interfaces, films) / 61.43.Hv – Fractals; macroscopic aggregates (including diffusion-limited aggregates) / 68.35.bm – Polymers, organics
© EDP Sciences, 2009
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