Issue |
Eur. Phys. J. Appl. Phys.
Volume 45, Number 2, February 2009
|
|
---|---|---|
Article Number | 20502 | |
Number of page(s) | 5 | |
Section | Surfaces, Interfaces and Films | |
DOI | https://doi.org/10.1051/epjap/2008189 | |
Published online | 31 January 2009 |
https://doi.org/10.1051/epjap/2008189
Spectroscopic study of interfaces in Al/Ni periodic multilayers
1
Laboratoire de Chimie-Physique - Matière et Rayonnement, UPMC Univ Paris
06, CNRS-UMR 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
2
Laboratoire de Magnétisme de Bretagne, FRE/CNRS 2697, Université de
Bretagne Occidentale, 6 avenue Le Gorgeu, CS 93837, 29238 Brest Cedex 3, France
Corresponding author: karine.le_guen@upmc.fr
Received:
7
July
2008
Accepted:
20
November
2008
Published online:
31
January
2009
Using electron-induced X-ray emission spectroscopy (XES), we have studied
two Al/Ni periodic multilayers that differ only by their annealing
temperature: as-deposited and annealed at 115 °C. Our aim is to show that
XES can provide further details about the chemistry at the metal-metal
interface, in addition to what is obtained by X-ray diffraction. The
distribution of valence states exhibiting Al 3p and Ni 3d character is
determined from the analysis of the Al and Ni
emission
bands respectively. The multilayer emission bands are compared to those of
reference materials: pure Al and Ni metals as well as Al3Ni,
Al3Ni2 and AlNi intermetallics. We provide evidence that, for
temperatures up to 115 °C, Al3Ni is the major component of the
multilayer.
PACS: 78.70.En – X-ray emission spectra and fluorescence / 68.65.Ac – Multilayers / 68.35.Bd – Metals and alloys
© EDP Sciences, 2008
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