This article has an erratum: [https://doi.org/10.1051/epjap/2010017]
Eur. Phys. J. Appl. Phys.
Volume 42, Number 3, June 2008
|Page(s)||345 - 350|
|Section||Instrumentation and Metrology|
|Published online||30 April 2008|
Perturbing effects of the probe support on the calibration of electric field meters
Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce
91, 10135 Torino, Italy
2 Dipartimento di Ingegneria Elettrica, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy
Corresponding author: firstname.lastname@example.org
Revised: 8 February 2008
Accepted: 3 March 2008
Published online: 30 April 2008
This paper aims at investigating the influence of the dielectric support on the indications of single axis and three-axis low frequency electric field meters obtained during their calibration. The modification of the calibration field due to the dielectric support, experienced by the meter probe, is predicted by a Boundary Element model and experimentally compared with the actual probe indication, considering both a parallel plate set-up and a TEM cell for the generation of the reference field. The perturbing effect, estimated for different dielectric supports, is found to be greatly amplified and frequency dependent when considering lossy dielectric materials.
PACS: 41.20.Cv – Electrostatics; Poisson and Laplace equations, boundary-value problems / 06.20.fb – Standards and calibration / 07.50.-e – Electrical and electronic instruments and components
© EDP Sciences, 2008
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