Eur. Phys. J. Appl. Phys.
Volume 37, Number 1, January 2007
|Page(s)||1 - 9|
|Section||Semiconductors and Related Materials|
|Published online||15 November 2006|
Structural and electrical properties of thermally evaporated cobalt phthalocyanine (CoPc) thin films
Physics department, faculty of girls, Jedda, Saudi Arabia Kingdom
2 Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt
Corresponding author: firstname.lastname@example.org
Revised: 22 August 2006
Accepted: 28 August 2006
Published online: 15 November 2006
Thin films of CoPc of various thickness have been deposited onto glass substrates using thermal evaporation technique at room temperature. The dark electrical resistivity measurements were carried out at different temperature range (298–423 K). An estimation of mean free path () of charge carriers in CoPc thin films and bulk resistivity, was attempted. Measurements of thermoelectric power confirm that CoPc thin films behave as p-type semiconductors. The ac conductivity (σac) has been investigated in the frequency range (102–106 Hz) and temperature range (298–407 K). σac is found to be proportional to ωs where s ≈ 0.879 which is frequency and temperature independence. The ac conductivity interpreted by the correlated barrier hopping (CBH) model with centers of intimate valence alternation pairs type with a maximum barrier height, WM ≈ 1.594 eV.
PACS: 72.20.-i – Conductivity phenomena in semiconductors and insulators / 77.55.+f – Dielectric thin films / 73.61.-r – Electrical properties of specific thin films
© EDP Sciences, 2006
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