| Issue |
Eur. Phys. J. Appl. Phys.
Volume 36, Number 2, November 2006
|
|
|---|---|---|
| Page(s) | 189 - 192 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap:2006115 | |
| Published online | 11 October 2006 | |
https://doi.org/10.1051/epjap:2006115
Map of spatial-dispersion induced birefringence losses in single-crystal silicon
École Supérieure de Physique et Chimie Industrielles de la ville de Paris, Laboratoire d'Optique Physique, CNRS, Unité Propre de Recherche 5,
10 rue Vauquelin, 75005 Paris, France
Corresponding author: moreau@optique.espci.fr
Received:
28
February
2006
Revised:
28
July
2006
Accepted:
10
August
2006
Published online:
11
October
2006
We report measurements of the birefringence-induced losses in silicon single crystals for [001] and [111] crystallographic orientation and for different doping levels. These results are compatible with the so-called spatial-dispersion-induced birefringence in cubic crystals. These angular maps have been used to fix some tolerances for the next generation of optics in the Virgo gravitational-wave detector.
PACS: 78.20.Fm – Birefringence / 95.55.Ym – Gravitational radiation detectors; mass spectrometers; and other instrumentation and techniques
© EDP Sciences, 2006
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