| Issue |
Eur. Phys. J. Appl. Phys.
Volume 35, Number 2, August 2006
|
|
|---|---|---|
| Page(s) | 145 - 148 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap:2006082 | |
| Published online | 12 July 2006 | |
https://doi.org/10.1051/epjap:2006082
Metrological analysis of shearography*
Laboratoire Central des Ponts et Chaussées, 58 boulevard Lefebvre, 75732 Paris Cedex 15, France
Corresponding author: frederic.taillade@lcpc.fr
Received:
26
April
2005
Revised:
22
November
2005
Accepted:
17
April
2006
Published online:
12
July
2006
This paper presents an uncertainty budget of measurement on the optical phase on the basis of a metrological analysis inspired from the “GUM” approach [GUM, Guide to the expression of Uncertainty in Measurement (ISBN 92-67-20188-9, 1993)]. This budget takes account of the procedure implemented in calibrating the phase-shifting device and in the actual phase measurement. This study leads to deriving an estimation of the standard uncertainty in measuring the optical path difference at approximately 
. This value agrees with a purely experimental estimate [F. Taillade, Association de la shearographie et des ondes de Lamb pour la détection rapide et quantitative des délaminages, Ph.D. thesis, Technical Note ONERA, NT 2001-3, 2001], which led to a standard uncertainty of roughly 
.
PACS: 06.20.-f – Metrology / 42.30.-d – Imaging and optical processing / 42.30.Ms – Speckle and moire patterns
© EDP Sciences, 2006
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