| Issue |
Eur. Phys. J. Appl. Phys.
Volume 31, Number 3, September 2005
|
|
|---|---|---|
| Page(s) | 179 - 183 | |
| Section | Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap:2005063 | |
| Published online | 14 September 2005 | |
https://doi.org/10.1051/epjap:2005063
Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino) -N-methylmaleimide thin film by spectroscopic ellipsometry
National Laboratory of Integrated Optoelectronics, Jilin University,
Changchun, 130012, China
Corresponding author: xiewenfa@mail.edu.cn
Received:
4
February
2005
Revised:
18
May
2005
Accepted:
8
June
2005
Published online:
14
September
2005
Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino)-N-methylmaleimide (NPAMLI) thin film grown on silicon substrate by thermal evaporation were investigated using variable angle spectroscopic ellipsometry (VASE). Accurate refractive index n and extinction coefficient k are reported in the energy range of 1.0 to 5.0 eV. Cauchy model, one-oscillator Lorentz model, and six-oscillator Lorentz model were used to fit the experiment data. The optical gap of NPAMLI and the visible absorption peaks at 2.35 and 2.87 eV were also derived from the VASE spectrum.
PACS: 29.30.-h – Spectrometers and spectroscopic techniques / 78.20.Ci – Optical constants / 78.66.Qn – Polymers; organic compounds
© EDP Sciences, 2005
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