| Issue |
Eur. Phys. J. Appl. Phys.
Volume 31, Number 3, September 2005
|
|
|---|---|---|
| Page(s) | 185 - 190 | |
| Section | Plasma, Discharges and Processes | |
| DOI | https://doi.org/10.1051/epjap:2005054 | |
| Published online | 18 August 2005 | |
https://doi.org/10.1051/epjap:2005054
The effective secondary electron emission coefficient of MgO protective layer in AC-PDP calculated by fitting breakdown voltage curves
1
Key laboratory for Physical Electronics and Devices of the Ministry of
Education of China, Xi'an Jiaotong University, P.R. China
2
Key laboratory of Opto-Electronic Technology and Intelligent Control of
Ministry of Education, Lanzhou Jiaotong University, P.R.
China
Corresponding author: guobingang@iped.xjtu.edu.cn
Received:
4
November
2004
Revised:
11
March
2005
Accepted:
15
April
2005
Published online:
18
August
2005
A convenient way is given in this paper to calculate the effective secondary
electron emission coefficient
(γ
)
of protective layers in AC-PDP by
fitting breakdown voltage curves. Based on the analysis of chemical kinetics
of gas discharging in Plasma Display Panels, we deduced an empirical
equation of self-sustaining discharge condition for Penning gas mixture in
terms of Townsend breakdown criteria. It was used to calculate the breakdown
voltage curves of Ne-Xe/MgO, Ne-Ar/MgO, Ne/MgO, Ar/MgO and Xe/MgO in a
testing macroscopic discharge cell of AC-PDP. The effective secondary
electron emission coefficients were derived by comparing the breakdown
voltage curves obtained from the empirical equation with the experimental
data of breakdown voltages. The γ
results showed a good conformity
with the secondary electron emission coefficients in literatures. The
empirical equation can be used as a convenient approach to research gas
discharge characteristics and the effective secondary electron emission
behaviors in plasma display panels.
PACS: 52.80. Sm – Magnetoactive discharges (e.g., Penning discharges) / 51.50.+v – Electrical properties (ionization, breakdown, electron and ion mobility, etc.)
© EDP Sciences, 2005
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