| Issue |
Eur. Phys. J. Appl. Phys.
Volume 30, Number 3, June 2005
|
|
|---|---|---|
| Page(s) | 171 - 174 | |
| Section | Surfaces, Interfaces and Films | |
| DOI | https://doi.org/10.1051/epjap:2005027 | |
| Published online | 14 April 2005 | |
https://doi.org/10.1051/epjap:2005027
Fingerprinting substitution sites in Pb,Dy-Bi2 Sr2 Ca1 Cu2 O8+δ using X-ray Photoelectron Diffraction
1
FR 7.2 Experimentalphysik, Universität des Saarlandes, 66123 Saarbrücken, Germany
2
Institut de Physique, Université de Neuchâtel, 2000 Neuchâtel, Switzerland
3
Institut de Physique Appliquée, EPF, 1015 Lausanne, Switzerland
Corresponding author: d.popovic@mx.uni-saarland.de
Received:
31
October
2004
Revised:
3
February
2005
Accepted:
18
February
2005
Published online:
14
April
2005
The substitution sites of Pb and Dy dopants in the cuprate-type high temperature superconductor Bi2Sr2Ca1Cu2O
are determined by a direct comparison of the angle-scanned X-ray photoelectron diffraction (XPD) patterns. We demonstrate the power of XPD as a fingerprinting tool and conclude that Pb occupies Bi sites and Dy the Ca sites. The presence of the incommensurate lattice modulation is not visible in XPD, probably due to a Pb-induced, reduced modulation amplitude.
PACS: 74.72.Hs – Bi-based cuprates / 61.14.Qp – X-ray photoelectron diffraction / 74.62.Dh – Effects of crystal defects, doping and substitution on superconducting transition temperature
© EDP Sciences, 2005
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