Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
|Page(s)||399 - 401|
|Published online||15 July 2004|
Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses
Centre d'Électronique et de Micro-optoelectronique de
Montpellier, Université Montpellier II, Place E. Bataillon,
34095 Montpellier Cedex 5, France
2 Commissariat à l'Énergie Atomique, Centre de Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Corresponding author: email@example.com
Accepted: 18 December 2003
Published online: 15 July 2004
A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.
PACS: 42.30.Wb – Image reconstruction; tomography / 78.35.+c – Brillouin and Rayleigh scattering; other light scattering / 42.70.Ce – Glasses, quartz
© EDP Sciences, 2004
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