| Issue |
Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
|
|
|---|---|---|
| Page(s) | 399 - 401 | |
| Section | Multi-techniques investigations | |
| DOI | https://doi.org/10.1051/epjap:2004070 | |
| Published online | 15 July 2004 | |
https://doi.org/10.1051/epjap:2004070
Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses
1
Centre d'Électronique et de Micro-optoelectronique de
Montpellier, Université Montpellier II, Place E. Bataillon,
34095 Montpellier Cedex 5, France
2
Commissariat à l'Énergie Atomique, Centre de Grenoble, 17
rue des Martyrs, 38054 Grenoble Cedex 9, France
Corresponding author: gall@cem2.univ-montp2.fr
Received:
10
July
2003
Accepted:
18
December
2003
Published online: 15 July 2004
A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.
PACS: 42.30.Wb – Image reconstruction; tomography / 78.35.+c – Brillouin and Rayleigh scattering; other light scattering / 42.70.Ce – Glasses, quartz
© EDP Sciences, 2004
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