Issue |
Eur. Phys. J. Appl. Phys.
Volume 24, Number 1, October 2003
|
|
---|---|---|
Page(s) | 85 - 90 | |
Section | Instrumentation and Metrology | |
DOI | https://doi.org/10.1051/epjap:2003070 | |
Published online | 29 September 2003 |
https://doi.org/10.1051/epjap:2003070
Heterodyne refractometer and air wavelength reference at 633 nm
1
LIRIS, 45 avenue des États-Unis, Université de Versailles Saint
Quentin, 78035 Versailles, France
2
BNM-INM/CNAM, 292 rue Saint-Martin, 75003 Paris, France
Corresponding author: suat.topcu@ens-phys.uvsq.fr
Received:
24
October
2002
Revised:
28
May
2003
Accepted:
15
July
2003
Published online:
29
September
2003
This paper presents new developments of the BNM-INM heterodyne compact refractometer. Air refractive index measurements have been made at 633 nm with a relative uncertainty of 10−8 and the realization of a new type of wavelength stabilized laser source has been demonstrated at 633 nm. We now have adapted this source to a commercial interferometric system working at 633 nm. Length variation measurements in air have been made. Results show that the wavelength of our source is insensitive to slow variations of the refractive index of air at a level of 10−8, demonstrating the possibility to make distance measurements in air without the need to make any index correction.
PACS: 06.30.-k – Measurements common to several branches of physics and astronomy / 42.62.Eh – Metrological applications; optical frequency synthesizers for precision spectroscopy
© EDP Sciences, 2003
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