| Issue |
Eur. Phys. J. AP
Volume 4, Number 3, December 1998
|
|
|---|---|---|
| Page(s) | 281 - 290 | |
| DOI | https://doi.org/10.1051/epjap:1998272 | |
| Published online | 15 December 1998 | |
https://doi.org/10.1051/epjap:1998272
Improvements in the treatment of elastic electron diffraction profiles for local order determination in polycristalline samples
Centre d'élaboration des matériaux et d'études structurales, 29 rue J. Marvig, BP 4347,
31055 Toulouse Cedex, France
Corresponding author: Galaup@cemes.fr
Received:
11
March
1998
Accepted:
3
July
1998
Published online: 15 December 1998
In this paper we describe how to record on-line filtered diffraction patterns rapidly with a serial electron energy loss spectrometer. A numerical treatment then yields the RDF for structural identification. Differents treatments ways of improving the accuracy of the results are proposed and examined in detail.
PACS: 61.14.Rq – Others electron diffraction and scattering techniques for structure analysis / 61.16.Bg – Transmission, reflection and scanning electron microscopy
© EDP Sciences, 1998
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