Issue |
Eur. Phys. J. AP
Volume 3, Number 1, July 1998
|
|
---|---|---|
Page(s) | 41 - 47 | |
DOI | https://doi.org/10.1051/epjap:1998202 | |
Published online | 15 July 1998 |
https://doi.org/10.1051/epjap:1998202
Control of gas-phase nucleation and flow visualization in a special cold wall CVD reactor
CNRS-IMP, University of Perpignan,
52 avenue de Villeneuve, 66860 Perpignan Cedex, France
Corresponding author: wang@univ-perp.fr
Received:
18
June
1997
Revised:
3
March
1998
Accepted:
31
March
1998
Published online: 15 July 1998
The deposition of the ternary compound Ti-N-Si using the cold-wall CVD technique from TiCl4-NH3-SiH2Cl2 presents difficulties because of undesired powder formation in the gas-phase. For a better understanding and control of the mechanism, both simulation and experiments have been carried out to determine favorable conditions to minimize the undesired adducts. First, an original technique has been developed for the reactive injection with a double-passage nozzle specially designed. Then powders have been deliberately grown at different conditions, with their chemical compositions analyzed using X-ray diffraction spectra. Further, the flow has been modeled and compared with the results provided by means of laser sheet visualization. It is shown that the powders can be avoided with some special reactive injection schemes and by controlling the nozzle exit-substrate distance. Some useful information is also delivered on controlling the color and the composition of powders during their synthesis.
PACS: 81.15.Gh – Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, etc.)
© EDP Sciences, 1998
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.