Issue |
Eur. Phys. J. AP
Volume 1, Number 1, January 1998
|
|
---|---|---|
Page(s) | 1 - 6 | |
DOI | https://doi.org/10.1051/epjap:1998107 | |
Published online | 15 January 1998 |
https://doi.org/10.1051/epjap:1998107
Reactive sputtering of YBaCuO thin films on polycrystalline zirconia substrates: optimization results*
1
Laboratoire de Génie Électrique de Paris,
Universités Paris VI et Paris XI (URA 127 CNRS), Supélec,
Plateau du Moulon, 91190 Gif-sur-Yvette, France
2
Unité mixte de Physique CNRS/Thomson-CSF (UMR 137),
Domaine de Corbeville, 91404 Orsay, France
Corresponding author: degardin@supelec.fr
Received:
13
June
1997
Accepted:
7
October
1997
Published online: 15 January 1998
In situ elaboration of YBaCuO thin films, on polycrystalline yttria doped zirconia substrates, has
been optimized. A reactive sputtering model has been developed and the electrical conductivity of the substrate
has been studied as a function of temperature and doping. The Jc value of
at 77 K, measured
on microbridges, is among the best reported in the literature for this
substrate type.
Résumé
L'élaboration in situ de films minces d'YBaCuO, sur substrats de zircone polycristalline dopée à
l'oxyde d'yttrium, a été optimisée en développant un modèle de pulvérisation réactive et en étudiant la
conductivité électrique du substrat en fonction du dopage et de la température. La valeur de
à 77 K, mesurée sur microponts, se situe parmi les meilleures
citées dans la littérature pour ce type de substrat.
PACS: 74.76.Bz – Hight-Tc films / 74.25.Fy – Transport properties (electric and thermal conductivity, thermoelectric effects, etc.)
© EDP Sciences, 1998
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.