Noise measurements on single electron transistors using bias switching read-out P. J. Hakonen, M. Kiviranta, J. S. Penttilä and M. A. Paalanen Eur. Phys. J. AP, 11 3 (2000) 227-229 Published online: 15 September 2000 DOI: 10.1051/epjap:2000165