The European Physical Journal Applied Physics (EPJ AP)

Cleaning InSb wafers for manufacturing InSb detectors

H. Simchi, Sh. Bahreani and M. H. Saani

Eur. Phys. J. Appl. Phys., 33 1 (2006) 1-4

Published online: 18 January 2006

DOI: 10.1051/epjap:2006001

H. Simchi

Sh. Bahreani

M. H. Saani

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