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MONOX: a characterization tool for the X-UV range

J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, P. Jonnard and H. Ringuenet

Eur. Phys. J. Appl. Phys., 31 2 (2005) 147-152

Published online: 18 August 2005

DOI: 10.1051/epjap:2005047

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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