The European Physical Journal Applied Physics (EPJ AP)

Non-contact C-V measurements of ultra thin dielectrics

P. Edelman, A. Savtchouk, M. Wilson, J. D'Amico, J. N. Kochey, D. Marinskiy and J. Lagowski

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 495-498

Published online: 15 July 2004

DOI: 10.1051/epjap:2004119-12

P. Edelman

A. Savtchouk

M. Wilson

J. D'Amico

J. N. Kochey

D. Marinskiy

J. Lagowski

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