The European Physical Journal Applied Physics (EPJ AP)

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

J. Bak-Misiuk, A. Misiuk, J. Ratajczak, A. Shalimov, I. Antonova and J. Trela

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 415-418

Published online: 15 July 2004

DOI: 10.1051/epjap:2004119-10

J. Bak-Misiuk

A. Misiuk

J. Ratajczak

A. Shalimov

I. Antonova

J. Trela

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