The European Physical Journal Applied Physics (EPJ AP)

Simultaneous quantitative determination of strain and defect profiles within the active region along high-power diode laser bars by micro-photocurrent mapping

A. Gerhardt, J. W. Tomm, S. Schwirzke-Schaaf, J. Nagle, M. Oudart and Y. Sainte-Marie

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 451-454

Published online: 15 July 2004

DOI: 10.1051/epjap:2004098

A. Gerhardt

J. W. Tomm

S. Schwirzke-Schaaf

J. Nagle

M. Oudart

Y. Sainte-Marie

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