Annealing ambient controlled deep defect formation in InP Y. W. Zhao, Z. Y. Dong, M. L. Duan, W. R. Sun, Y. P. Zeng, N. F. Sun and T. N. Sun Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 167-169 Published online: 15 July 2004 DOI: 10.1051/epjap:2004096