The European Physical Journal Applied Physics (EPJ AP)

Defect imaging in ultra-thin SiGe (100) strain relaxed buffers

J. Werner, K. Lyutovich and C. P. Parry

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 367-370

Published online: 15 July 2004

DOI: 10.1051/epjap:200373

J. Werner

K. Lyutovich

C. P. Parry

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