The European Physical Journal Applied Physics (EPJ AP)

In-situ microscopy study of nanocavity shrinkage in Si under ion beam irradiation

M.-O. Ruault, M. C. Ridgway, F. Fortuna, H. Bernas and J. S. Williams

Eur. Phys. J. AP, 23 1 (2003) 39-40

Published online: 11 December 2002

DOI: 10.1051/epjap:2002120

M.-O. Ruault

M. C. Ridgway

F. Fortuna

H. Bernas

J. S. Williams

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