The European Physical Journal Applied Physics (EPJ AP)

Transmission electron microscopy of NdNiO₃ thin films on silicon substrates

P. Laffez, R. Retoux, P. Boullay, M. Zaghrioui, P. Lacorre and G. van Tendeloo

Eur. Phys. J. AP, 12 1 (2000) 55-60

Published online: 15 October 2000

DOI: 10.1051/epjap:2000171

P. Laffez

R. Retoux

P. Boullay

M. Zaghrioui

P. Lacorre

G. van Tendeloo

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