The European Physical Journal Applied Physics (EPJ AP)

Ebic contrast in a polycrystalline semiconductor: Grain size dependence

M. C. Talai, D. E. Mekki and R. J. Tarento

Eur. Phys. J. AP, 8 1 (1999) 1-5

Published online: 15 October 1999

DOI: 10.1051/epjap:1999222

M. C. Talai

D. E. Mekki

R. J. Tarento

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