The European Physical Journal Applied Physics (EPJ AP)

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Analysis of superconducting silicon epilayers by atom probe tomography: composition and evaporation field

Khalid Hoummada, Franck Dahlem, Federico Panciera, Etienne Bustarret, C. Marcenat, Dominique Débarre, Youssef El Amraoui and Dominique Mangelinck

Eur. Phys. J. Appl. Phys., 98 (2023) 40

Published online: 09 June 2023

DOI: 10.1051/epjap/2023230018

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Khalid Hoummada

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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