The European Physical Journal Applied Physics (EPJ AP)

Eliminating failure behavior by introducing CdS inter-layer in Cu₂O-based memory cell

Weijie Duan, Zhenxing Liu and Yang Zhang

Eur. Phys. J. Appl. Phys., 81 2 (2018) 20101

Published online: 08 June 2018

DOI: 10.1051/epjap/2018180008

Weijie Duan

Zhenxing Liu

Yang Zhang

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