The European Physical Journal Applied Physics (EPJ AP)

Design, development and applications of etched multilayers for soft X-ray spectroscopy

Karine Le Guen, Rabah Benbalagh, Jean-Michel André, Jean-René Coudevylle and Philippe Jonnard

Eur. Phys. J. Appl. Phys., 78 2 (2017) 20702

Published online: 19 May 2017

DOI: 10.1051/epjap/2017160287

Karine Le Guen

Rabah Benbalagh

Jean-Michel André

Jean-René Coudevylle

Philippe Jonnard

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