The European Physical Journal Applied Physics (EPJ AP)

Modeling of metal-ferroelectric-insulator-semiconductor structure considering the effects of interface traps

Jing Sun, Xiao Rong Shi, Xue Jun Zheng, Li Tian and Zhe Zhu

Eur. Phys. J. Appl. Phys., 70 3 (2015) 30101

Published online: 24 June 2015

DOI: 10.1051/epjap/2015140522

Jing Sun

Xiao Rong Shi

Xue Jun Zheng

Li Tian

Zhe Zhu

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