The European Physical Journal Applied Physics (EPJ AP)

Local current conduction due to edge dislocations in deformed GaN studied by scanning spreading resistance microscopy

Takashi Yokoyama, Yasushi Kamimura, Keiichi Edagawa and Ichiro Yonenaga

Eur. Phys. J. Appl. Phys., 61 1 (2013) 10102

Published online: 14 January 2013

DOI: 10.1051/epjap/2012120318

Takashi Yokoyama

Yasushi Kamimura

Keiichi Edagawa

Ichiro Yonenaga

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