The European Physical Journal Applied Physics (EPJ AP)

The waveguide method for measuring parameters of the surface layers

S.S. Danilenko and A.N. Osovitskii

Eur. Phys. J. Appl. Phys., 59 1 (2012) 11301

Published online: 16 July 2012

DOI: 10.1051/epjap/2012120068

S.S. Danilenko

A.N. Osovitskii

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