The European Physical Journal Applied Physics (EPJ AP)

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Advanced backside sample preparation for multi-technique surface analysis

M. Py, M. Veillerot, J.M. Fabbri, F. Pierre, D. Jalabert, C. Roukoss, B. Pelissier, R. Boujamaa, C. Trouiller and J.P. Barnes

Eur. Phys. J. Appl. Phys., 55 3 (2011) 31001

Published online: 18 August 2011

DOI: 10.1051/epjap/2011110191

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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