The European Physical Journal Applied Physics (EPJ AP)

In-plane strain states of standard and flip-chip GaN epilayers

Z. Y. Zuo, D. Liu, R. J. Wang, S. B. Qin, H. Liu and X. G. Xu

Eur. Phys. J. Appl. Phys., 54 1 (2011) 10101

Published online: 13 April 2011

DOI: 10.1051/epjap/2011100454

Z. Y. Zuo

D. Liu

R. J. Wang

S. B. Qin

H. Liu

X. G. Xu

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