The European Physical Journal Applied Physics (EPJ AP)

Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

K. Suenaga, Y. Iizumi and T. Okazaki

Eur. Phys. J. Appl. Phys., 54 3 (2011) 33508

Published online: 09 June 2011

DOI: 10.1051/epjap/2011100414

K. Suenaga

Y. Iizumi

T. Okazaki

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