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Study of traps in polydiacetylene based devices using TSC technique

C. Renaud, C. H. Huang, M. Zemmouri, P. Le Rendu and T. P. Nguyen

Eur. Phys. J. Appl. Phys., 36 3 (2006) 215-218

DOI: https://doi.org/10.1051/epjap:2006139

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