Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Isothermal deep-level transient spectroscopy study of metastable defects in hydrogen-implanted n-type silicon

Yutaka Tokuda, Wakana Nakamura and Hiroshi Terashima
Materials Science in Semiconductor Processing 9 (1-3) 288 (2006)
DOI: 10.1016/j.mssp.2006.01.053
See this article

Transformation behavior of room-temperature-stable metastable defects in hydrogen-implanted n-type silicon studied by isothermal deep-level transient spectroscopy

Yutaka Tokuda
Journal of Applied Physics 100 (2) 023704 (2006)
DOI: 10.1063/1.2216430
See this article

Characterization of a metastable defect labeled EM3 in hydrogen-implanted n-type silicon using deep-level transient spectroscopy

Yutaka Tokuda and Takeshi Seo
Journal of Materials Science: Materials in Electronics 19 (S1) 281 (2008)
DOI: 10.1007/s10854-007-9553-5
See this article

Enhancement of Defect Production Rates in n-Type Silicon by Hydrogen Implantation Near 270 K

Yutaka Tokuda, Youichi Nagae, Hitoshi Sakane and Jyoji Ito
Journal of Electronic Materials 39 (6) 719 (2010)
DOI: 10.1007/s11664-010-1138-z
See this article