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Cited article:

Imaging of spontaneous emission from 980 nm tapered lasers with windowed N-contacts

S. Bull, J. G. Wykes, A. V. Andrianov, J. J. Lim, L. Borruel, S. Sujecki, S. C. Auzanneau, M. Calligaro, M. Krakowski, I. Esquivias

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 455-459

Published online: 2004-07-15

DOI: https://doi.org/10.1051/epjap:2004059

This article has been cited by the following article(s):

Handbook of Optoelectronic Device Modeling and Simulation

Series in Optics and Optoelectronics, Handbook of Optoelectronic Device Modeling and Simulation 81 (2017)
https://doi.org/10.1201/9781315152318-6

A Spectroscopically Resolved Photo- and Electroluminescence Microscopy Technique for the Study of High-Power and High-Brightness Laser Diodes

S. Bull, A.V. Andrianov, I. Harrison, M. Dorin, R.B. Kerr, J. Noto and E.C. Larkins
IEEE Transactions on Instrumentation and Measurement 54 (3) 1079 (2005)
https://doi.org/10.1109/TIM.2005.847219