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Fowler-Nordheim Current Oscillations Analysis of Metal/Ultra-Thin Oxide/Semiconductor Structures

Y. Khlifi, K. Kassmi, L. Roubi and R. Maimouni
physica status solidi (a) 182 (2) 737 (2000)
DOI: 10.1002/1521-396X(200012)182:2<737::AID-PSSA737>3.0.CO;2-6
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Fowler-Nordheim current modeling of metal/ultra-thin oxide/semiconductor structures in the inversion mode, defects characterization

Y. Khlifi, K. Kassmi, A. Aziz and F. Olivie
The European Physical Journal Applied Physics 28 (1) 27 (2004)
DOI: 10.1051/epjap:2004157
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Ageing of metal/ultra-thin oxide/semiconductor structures under Fowler–Nordheim current injection

K Kassmi, A Aziz and F Olivie
Nanotechnology 15 (1) 237 (2004)
DOI: 10.1088/0957-4484/15/1/043
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