Determination of the electron mean free path in the 1–1.8 eV energy range in thin gold layers using ballistic electron emission microscopy
Eur. Phys. J. AP, 5 3 (1999) 237-242
Published online: 1999-03-15
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Catalytic Hot-Electron SERS Analytical Substrates and a Case Study on Graphene Nanocomposite Inspection
Kitiphat Sinthiptharakoon, Tuksadon Wutikhun, Alongkot Treetong, et al.The Journal of Physical Chemistry C 126 (48) 20437 (2022)
https://doi.org/10.1021/acs.jpcc.2c05432
Design and manufacturing of an electrostatic MEMS relay for high power applications
Florian Copt, Yoan Civet, Christian Koechli and Yves PerriardSensors and Actuators A: Physical 321 112569 (2021)
https://doi.org/10.1016/j.sna.2021.112569
Interfacial scattering of hot electrons in ultrathin Au/Co films
R. P. Lu, B. A. Morgan, K. L. Kavanagh, et al.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 18 (4) 2047 (2000)
https://doi.org/10.1116/1.1306334