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Cited article:

Atom probe tomography in nanoelectronics

Didier Blavette, Sébastien Duguay

Eur. Phys. J. Appl. Phys., 68 1 (2014) 10101

Published online: 2014-09-26

DOI: https://doi.org/10.1051/epjap/2014140060

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