The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
This article has been cited by the following article(s):
Carrier Activation at End-of-Range (EOR) Defects and Grain Boundaries in Boron-Doped Silicon
Yi-Yao Li, Yu-Chen Yang, Tung-Huan Chou, Yu-Lin Huang, Chia-He Chang, Ya-Lan Hsu and Kun-Lin Lin Journal of Electronic Materials 54(3) 2211 (2025) https://doi.org/10.1007/s11664-024-11725-2
Order and disorder at the atomic scale: Microscopy applied to semiconductors
Enrico Di Russo, Tom Verstijnen, Paul Koenraad, Konstantinos Pantzas, Gilles Patriarche and Lorenzo Rigutti Reviews of Modern Physics 97(2) (2025) https://doi.org/10.1103/RevModPhys.97.025006
On the Characteristics and Role of Cottrell Co-Segregations of Carbon and Hydrogen in Strain Aging and Embrittlement of a Number of Steels
Yu. S. Nechaev, E. A. Denisov, N. A. Shurygina, A. O. Cheretaeva, N. S. Morozov, V. P. Filippova and N. M. Alexandrova Поверхность. Рентгеновские, синхротронные и нейтронные исследования (12) 90 (2023) https://doi.org/10.31857/S1028096023120178
Cottrell Cosegregations of Carbon and Hydrogen: Characteristics and Role in the Strain Aging and Embrittlement of Steels
Yu. S. Nechaev, E. A. Denisov, N. A. Shurygina, A. O. Cheretaeva, N. S. Morozov, V. P. Filippova and N. M. Alexandrova Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 17(6) 1395 (2023) https://doi.org/10.1134/S1027451023060393
Quantifying lithium enrichment at grain boundaries in Li7La3Zr2O12 solid electrolyte by correlative microscopy
Examining the Effect of Evaporation Field on Boron Measurements in SiGe: Insights into Improving the Relationship Between APT and SIMS Measurements of Boron
Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N
L. Rigutti, L. Mancini, D. Hernández-Maldonado, W. Lefebvre, E. Giraud, R. Butté, J. F. Carlin, N. Grandjean, D. Blavette and F. Vurpillot Journal of Applied Physics 119(10) (2016) https://doi.org/10.1063/1.4943612