Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

On treatment of ultra-low-k SiCOH in CF4 plasmas: correlation between the concentration of etching products and etching rate

N. Lang, S. Zimmermann, H. Zimmermann, et al.
Applied Physics B 119 (1) 219 (2015)
DOI: 10.1007/s00340-015-6063-7
See this article

Depleted-heterojunction colloidal quantum dot photovoltaics employing low-cost electrical contacts

Ratan Debnath, Mark T. Greiner, Illan J. Kramer, et al.
Applied Physics Letters 97 (2) 023109 (2010)
DOI: 10.1063/1.3463037
See this article

Monometallic Cerium Layered Double Hydroxide Supported Pd-Ni Nanoparticles as High Performance Catalysts for Lignin Hydrogenolysis

Tibo De Saegher, Jeroen Lauwaert, Jorku Hanssen, et al.
Materials 13 (3) 691 (2020)
DOI: 10.3390/ma13030691
See this article

Study of resistive random access memory based on TiN/TaOx/TiN integrated into a 65nm advanced complementary metal oxide semiconductor technology

Therese Diokh, Elise Le-Roux, Simon Jeannot, et al.
Thin Solid Films 533 24 (2013)
DOI: 10.1016/j.tsf.2012.11.124
See this article

Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X-Ray Techniques Using Lab-Based and Synchrotron Radiation Sources

Ehrenfried Zschech, Christophe Wyon, Conal E. Murray and Gerd Schneider
Advanced Engineering Materials 13 (8) 811 (2011)
DOI: 10.1002/adem.201000327
See this article

Spectroscopic ellipsometry characterization of high-k gate stacks with Vt shift layers

Ming Di, Eric Bersch, Robert Clark, et al.
Thin Solid Films 519 (9) 2889 (2011)
DOI: 10.1016/j.tsf.2010.12.060
See this article

X-Ray Diffraction: Instrumentation and Applications

Andrei A. Bunaciu, Elena gabriela Udriştioiu and Hassan Y. Aboul-Enein
Critical Reviews in Analytical Chemistry 45 (4) 289 (2015)
DOI: 10.1080/10408347.2014.949616
See this article

Direct imaging of the SSD and USB memory drives heating by thermo-elastic optical indicator microscopy

Shant Arakelyan, Hanju Lee, Yeonghun Jeong, et al.
Case Studies in Thermal Engineering 10 407 (2017)
DOI: 10.1016/j.csite.2017.09.008
See this article

Assessing failure in epitaxially encapsulated micro-scale sensors using micro and nano x-ray computed tomography

Lizmarie Comenencia Ortiz, David B. Heinz, Ian B. Flader, et al.
MRS Communications 8 (02) 275 (2018)
DOI: 10.1557/mrc.2018.70
See this article