Optical and microwave characteristics of ambient temperature deposited zirconium tin titanate high-k films
Eur. Phys. J. Appl. Phys., 44 1 (2008) 71-75
Published online: 2008-08-06
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Single composite target magnetron sputter deposition of crystalline and amorphous SiC thin films
Poreddy Chaitanya Akshara, Guruswamy Rajaram and M Ghanashyam KrishnaMaterials Research Express 5 (3) 036410 (2018)
https://doi.org/10.1088/2053-1591/aab3b0
Structural, optical, dielectric and electrical studies on RF sputtered nanocrystalline Zr doped MgTiO3 thin films
Pallabi Gogoi, T. Santhosh Kumar, Pramod Sharma and D. PamuJournal of Alloys and Compounds 619 527 (2015)
https://doi.org/10.1016/j.jallcom.2014.09.077
Effect of post annealing on structural, optical and dielectric properties of MgTiO3 thin films deposited by RF magnetron sputtering
T. Santhosh Kumar, R.K. Bhuyan and D. PamuApplied Surface Science 264 184 (2013)
https://doi.org/10.1016/j.apsusc.2012.09.168
Dielectric properties of ambient temperature grown nanocrystalline ZrTiO4 thin films using DC magnetron sputtering
D. Pamu, K. Sudheendran, M. Ghanashyam Krishna and K.C. James RajuMaterials Science and Engineering: B 168 (1-3) 208 (2010)
https://doi.org/10.1016/j.mseb.2009.12.028
Preparation and Characterization of ZST Films for CMOS Applications
D. Pamu, K. Sudheendran, M. Ghanashyam Krishna and K. C. James RajuIntegrated Ferroelectrics 117 (1) 110 (2010)
https://doi.org/10.1080/10584587.2010.489433