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Roughness Evolution and Charging in Plasma-Based Surface Engineering of Polymeric Substrates: The Effects of Ion Reflection and Secondary Electron Emission
Characteristics of dielectric film charging, depending on their thickness upon electron irradiation
A. V. Gostev, E. N. Evstaf’eva, E. I. Rau, A. M. Tagachenkov and A. A. Tatarintsev Bulletin of the Russian Academy of Sciences: Physics 78(9) 833 (2014) https://doi.org/10.3103/S106287381409007X
Complex investigations of effects of charging a polymer resist (PMMA) during electron lithography
Contrast within images of locally charged dielectrics in scanning electron microscopy
E. I. Rau and A. A. Tatarintsev Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 6(6) 911 (2012) https://doi.org/10.1134/S1027451012110080
Imaging of CNTs in a polymer matrix at low accelerating voltages using a SEM
Secondary electron emission yield calculation performed using two different Monte Carlo strategies
Maurizio Dapor Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 269(14) 1668 (2011) https://doi.org/10.1016/j.nimb.2010.11.029
Comparison between Energy Straggling Strategy and Continuous Slowing Down Approximation in Monte Carlo Simulation of Secondary Electron Emission of Insulating Materials
Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy
Microwave window breakdown experiments and simulations on the UM/L-3 relativistic magnetron
B. W. Hoff, P. J. Mardahl, R. M. Gilgenbach, M. D. Haworth, D. M. French, Y. Y. Lau and M. Franzi Review of Scientific Instruments 80(9) (2009) https://doi.org/10.1063/1.3233917
Charge transportation and permittivity in electron beam irradiated polymethyl methacrylate
Feihu Zheng, Yewen Zhang, Junfeng Xia, Chun Xiao and Zhenlian An Journal of Applied Physics 106(6) (2009) https://doi.org/10.1063/1.3223330
Second crossover energy of insulating materials using stationary electron beam under normal incidence
E.I. Rau, S. Fakhfakh, M.V. Andrianov, et al. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266(5) 719 (2008) https://doi.org/10.1016/j.nimb.2007.12.093
An experimental study of the charging regime of the composite (PANI5%/PMMA)