EDP Sciences logo
Subscriber Authentication Point
Search
Menu
All issues Eur. Phys. J. Appl. Phys., 31 2 (2005) 147-152 Article references

Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Design, development and applications of etched multilayers for soft X-ray spectroscopy

Karine Le Guen, Rabah Benbalagh, Jean-Michel André, Jean-René Coudevylle and Philippe Jonnard
The European Physical Journal Applied Physics 78 (2) 20702 (2017)
https://doi.org/10.1051/epjap/2017160287

Co/Mo2 C multilayer as X-ray mirror: Optical and thermal performances

Yanyan Yuan, Karine Le Guen, Jean-Michel André, et al.
physica status solidi (b) 251 (4) 803 (2014)
https://doi.org/10.1002/pssb.201350082

An etched multilayer as a dispersive element in a curved‐crystal spectrometer: implementation and performance

P. Jonnard, K. Le Guen, J.‐M. André, J.‐R. Coudevylle and N. Isac
X-Ray Spectrometry 41 (5) 308 (2012)
https://doi.org/10.1002/xrs.2398

DUVEX: An X-ray counting system based on YAG:Ce scintillator

J.-M. André, K. Le Guen, P. Jonnard and Y. Ménesguen
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 659 (1) 318 (2011)
https://doi.org/10.1016/j.nima.2011.08.010

Effect of B4C diffusion barriers on the thermal stability of Sc/Si periodic multilayers

Philippe Jonnard, Hélène Maury, Karine Le Guen, et al.
Surface Science 604 (11-12) 1015 (2010)
https://doi.org/10.1016/j.susc.2010.03.012

High‐resolution x‐ray analysis with multilayer gratings

P. Jonnard, K. Le Guen and J.‐M. André
X-Ray Spectrometry 38 (2) 117 (2009)
https://doi.org/10.1002/xrs.1128

Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers

H. Maury, P. Jonnard, K. Le Guen, et al.
The European Physical Journal B 64 (2) 193 (2008)
https://doi.org/10.1140/epjb/e2008-00290-x

X-ray spectroscopic application of Cr∕Sc periodic multilayers

K. Le Guen, H. Maury, J.-M. André, et al.
Applied Physics Letters 91 (23) 234104 (2007)
https://doi.org/10.1063/1.2821379

Multilayer interference mirrors as components for soft x‐ray WDS monochromators and tunable radiation sources

J.‐M. André, P. Jonnard and R. Benbalagh
X-Ray Spectrometry 36 (2) 62 (2007)
https://doi.org/10.1002/xrs.933