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Cited article:

Defect imaging in ultra-thin SiGe (100) strain relaxed buffers

J. Werner, K. Lyutovich, C. P. Parry

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 367-370

Published online: 2004-07-15

DOI: https://doi.org/10.1051/epjap:200373

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