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This article has been cited by the following article(s):
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Calculation and analysis of thermal impedance of microelectronic structures from analytical models
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Characterization of self-heating in Si–Ge HBTs with pulse, DC and AC measurements
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Amit Kumar Sahoo, Sébastien Fregonese, Thomas Zimmer and Nathalie Malbert IEEE Electron Device Letters 32(2) 119 (2011) https://doi.org/10.1109/LED.2010.2091252
Thermal impedance and transient temperature due to a spot of heat on a half-space