Articles citing this article

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Cited article:

A Study on Self-Heating and Mutual Thermal Coupling in SiGe Multi-Finger HBTs

A. D. D. Dwivedi, Rosario D’Esposito, Amit Kumar Sahoo, Sebastien Fregonese and Thomas Zimmer
Journal of Electronic Materials 45 (11) 5612 (2016)
https://doi.org/10.1007/s11664-016-4728-6

Calculation and analysis of thermal impedance of microelectronic structures from analytical models

S. Vintrou, N. Laraqi and A. Baïri
Solid-State Electronics 67 (1) 45 (2012)
https://doi.org/10.1016/j.sse.2011.07.014

Transient electro-thermal characterization of Si–Ge heterojunction bipolar transistors

Amit Kumar Sahoo, Mario Weiß, Sébastien Fregonese, Nathalie Malbert and Thomas Zimmer
Solid-State Electronics 74 77 (2012)
https://doi.org/10.1016/j.sse.2012.04.015

Characterization of self-heating in Si–Ge HBTs with pulse, DC and AC measurements

Amit Kumar Sahoo, Sébastien Fregonese, Mario Weiß, et al.
Solid-State Electronics 76 13 (2012)
https://doi.org/10.1016/j.sse.2012.04.039

A Scalable Electrothermal Model for Transient Self-Heating Effects in Trench-Isolated SiGe HBTs

Amit Kumar Sahoo, Sébastien Fregonese, Mario Weis, Nathalie Malbert and Thomas Zimmer
IEEE Transactions on Electron Devices 59 (10) 2619 (2012)
https://doi.org/10.1109/TED.2012.2209651

Thermal Impedance Modeling of Si–Ge HBTs From Low-Frequency Small-Signal Measurements

Amit Kumar Sahoo, Sébastien Fregonese, Thomas Zimmer and Nathalie Malbert
IEEE Electron Device Letters 32 (2) 119 (2011)
https://doi.org/10.1109/LED.2010.2091252