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Cited article:

In-situ microscopy study of nanocavity shrinkage in Si under ion beam irradiation

M.-O. Ruault, M. C. Ridgway, F. Fortuna, H. Bernas, J. S. Williams

Eur. Phys. J. AP, 23 1 (2003) 39-40

Published online: 2002-12-11

DOI: https://doi.org/10.1051/epjap:2002120

This article has been cited by the following article(s):

Superheating and melting of nanocavities

G. Ouyang, X. L. Li and G. W. Yang
Applied Physics Letters 92 (5) (2008)
https://doi.org/10.1063/1.2833258

Enhanced interface mixing of Fe∕Si bilayers on preamorphized silicon substrates

N. Bibić, V. Milinović, K. P. Lieb, M. Milosavljević and F. Schrempel
Applied Physics Letters 90 (5) 051901 (2007)
https://doi.org/10.1063/1.2432952